SuSix is intuitive and easy to calibrate and is produced for long term work in harsh environments.
MJK SuSix provides data allowing you to control the amount of active solids in the process tank thereby obtaining the optimal environment for biology process.
The products can be used to control and improve the daily processes on waste water, drinking water or aqua culture applications.
SuSix sensor has six optical windows ensuring optimal analysis of the amount of suspended solids in the waste water process - as well as in the turbidity of the outlet water.
The turbidity range covers 0,001-9999 FNU/NTU/FTU and suspended solids are measured in the range of 0,001g/l to 400 g/l.
Output can be read directly on the converter display or transferred via Modbus, 4-20mA to, for instance, a SCADA system. To ensure safe installation, the SuSix is cUL certified.
The embedded algorithms ensure that 90% of all applications measuring suspended solids only require 1-point calibration. Should a calibration be necessary, SuSix can be re-calibrated for different measurement areas at any given time. You can even switch from suspended solid to turbidity measurement very easily.
The converter stores up to 160,000 data points with time and date stamp for statistic purposes.
Enclosure Rating |
Display: Dust and waterproof IP 67, NEMA 6 (mounted on converter) Converter: IP 67, NEMA 4x |
Indication | Indication measurement, configuration and graph |
Communication | Modbus® RTU-mode, 9600 baud, 2-wire RS-485, master |
Memory | 2 Mb Flash memory, 160.000 entries with date, time, value |
Interface | USB 1,1 type mini B, Female |
Accuracy |
Converter: +/- 0,1% of reading Sensor: Better than 3% of actual concentration (Turbidity) Better than 5% of actual concentration (depends on calibration and media) (SS) |
Power Supply | 230 V AC, 50 / 60 Hz ± 10 % or 115 V AC, 50 / 60 Hz ± 10 % or 10 - 30 V DC, or 24 V AC, 50 / 60 Hz ± 10 % |
Turbidity | 0.001 - 9999 FNU/NTU |
Suspended Solids | 0.001 - 400 g/l (SiO2) |
Measurement Principle | Infrared-diode system and beam focusing (l = 860 nm) |